Cibin Sebastian

Automotive Chip DFT :

o Proficient in DFT methodologies for automotive chips.

o Worked on cluster-level and top-level scan insertion, ATPG, and simulations.

Fault Models Expertise :

o Extensive experience with various fault models, including stuck-at, transition, IDDQ, cell-aware, and UDFM.

LBIST (Logic Built-In Self-Test) :

o Skilled in LBIST techniques.

Coverage Analysis :

o Analyzed test coverage for stuck-at, transition, and LBIST.

o Work along with IP teams for coverage analysis and give feedback.

Retargeting and Simulations :

o Proficient in retargeting and conducting top-level simulations.

o Debugged issues during simulations.

SpyGlass DFT :

o Utilized SpyGlass for RTL cleanup in DFT flows.

Silicon Diagnosis and Bring-Up :

o Experience in silicon bring-up activities and post-silicon support.

Scan Insertion:

o Worked on scan insertion at the cluster level.

o Conducted DRC analysis during scan insertion and provided feedback to the design team for RTL updates.

ATPG :

o Set up ATPG and simulation environments for stuck-at and transition tests.

o Achieved detailed coverage analysis, with 99% stuck-at and 90% transition coverage.

Retargeting and Simulations:

o Performed retargeting and executed top-level Extest ATPG and simulations.

Verification:

o TAP network integration and verification for the SOC.

Silicon Bring-Up and Support:

o Contributed to silicon bring-up activities.

o Provided comprehensive support throughout the silicon lifecycle.