Ketankumar Rameshbhai Pansuriya

Development of selective laser-induced etching process(SLE).

Processing of transparent materials with ultra-short pulsed laser radiation.

Customer-specific process optimization with project management, implementation & transfer to the customer and to the production department.

Development, manufacturing and characterisation of stamps for ultrasonic hot embossing of optical components.

Thoroughly investigated a diverse range of process parameters involved in the precision development of stamps using silicon, silicon carbide, and steel wafers from Thin film Technology, Photolithography, wet etching processes, Dry etching processes, SCIA, and Dicing process.

Characterized of stamps by Measurement and Analysis Methods ( Confocal Laser Scanning Microscopy, Dektak, Surface Roughness profilometry, White light interferometry etc. ).

Utilized stamps of grating structure with the highest possible temperature stability (> 500 °C) and the lowest possible surface roughness on polymer and glass materials by Ultrasonic hot embossing process.

Development of 3D (curved) imaging Method for Muller Matrix Polarimetry.

Utilized MATLAB for analysis of Polarized Image Data. Employed with Image segmentation, and Shape analysis.

Used 3D imaging method in contactless dermoscopy for detecting cancer tissues.

Used of Michelson Interferometer and its uses for measurements of precision distance, the thickness of optical elements.

Conducted analysis of color space and working of the recent projector and its uses.

Determined various attenuations in optical fibers.

Determined the wavelength of emitted light from various optical lamps by using a diffraction grating.